The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2018

Filed:

Jan. 28, 2016
Applicant:

Si-ware Systems, Cairo, EG;

Inventors:

Diaa Khalil, Cairo, EG;

Bassam A. Saadany, Nasr, EG;

Yasser M. Sabry, Nasr, EG;

Assignee:

Si-Ware Systems, Cairo, EG;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01); G01J 3/45 (2006.01); G01J 3/10 (2006.01); G01J 3/02 (2006.01); G01J 3/26 (2006.01); G01J 3/453 (2006.01);
U.S. Cl.
CPC ...
G01J 3/45 (2013.01); G01J 3/0256 (2013.01); G01J 3/108 (2013.01); G01J 3/26 (2013.01); G01J 3/453 (2013.01); G01J 3/4531 (2013.01); G01J 3/4532 (2013.01); G01J 3/4535 (2013.01);
Abstract

A spectrometer with increased optical throughput and/or spectral resolution includes a plurality of interferometers coupled in parallel. An optical splitter divides a source light beam into a plurality of input beams and directs each of the input beams to a respective one of the plurality of interferometers. One or more detectors are optically coupled to receive a respective output from each of the plurality of interferometers and is configured to detect an interferogram produced as a result of the outputs.


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