The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2018
Filed:
Sep. 22, 2015
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventors:
Kazunori Sakurai, Chino, JP;
Hirokazu Kasahara, Okaya, JP;
Assignee:
Seiko Epson Corporation, , JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01); G01J 3/28 (2006.01); G01J 3/26 (2006.01);
U.S. Cl.
CPC ...
G01J 3/28 (2013.01); G01J 3/26 (2013.01);
Abstract
A spectroscopic analysis apparatus includes a spectrum measurement unit that measures an optical spectrum of a measurement target, a storage unit that stores reference data in which an intrinsic wavelength with respect to a known component is recorded, a feature specification section that specifies a feature point corresponding to the intrinsic wavelength in the optical spectrum which is measured by using the reference data, and a wavelength correction section that corrects a wavelength of the feature point in the optical spectrum as the intrinsic wavelength.