The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2018
Filed:
Jun. 01, 2015
Leica Geosystems Ag, Heerbrugg, CH;
Bernd Möller, Lüchingen, CH;
David Grimm, Zürich, CH;
Falko Henning, Bodolz, CH;
Hans-Martin Zogg, Uttwil, CH;
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Abstract
The invention pertains to a target point detection method for an automatic search of at least one target point in a surveying environment in advance of a precise measurement of the at least one target point with a surveying device. In some embodiments, the surveying environment may include a plurality of points of non-interest, where a point of non-interest is a reflective object or surface, or a target comprising at least one retroreflector being positioned at each target point. In some embodiments, a method may include emitting electromagnetic radiation to illuminate retroreflectors emitted in the form of a vertical fan which is movable through a horizontal angular range; receiving signals reflected from retroreflectors within a fan-shaped detection area, determining at least a horizontal angle to the retroreflectors, assigning a time mark and/or a distance to each of the signals, and storing the detected signal in a two-dimensional data structure.
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