The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2018

Filed:

Nov. 21, 2014
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Takahisa Suzuki, Yokohama, JP;

Koichiro Yamashita, Hachioji, JP;

Koji Kurihara, Kawasaki, JP;

Toshiya Otomo, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/00 (2006.01); G01C 15/00 (2006.01);
U.S. Cl.
CPC ...
G01C 15/00 (2013.01);
Abstract

An event location analysis system includes a first wireless terminal device. The first wireless terminal device includes a first measurement unit, a second measurement unit, and a first processor. The second measurement unit consumes larger amounts of power than the first measurement unit consumes. The first processor is configured to transmit a first notification signal upon detecting a first event on basis of a measurement value of the first measurement unit. The first processor is configured to start the second measurement unit upon receiving a second notification signal. The first processor is configured to activate a measurement operation of the first measurement unit and a measurement operation of the second measurement unit after the second measurement unit is started. The first processor is configured to stop the measurement operation of the second measurement unit after a predetermined time has elapsed since the start of the second measurement unit.


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