The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2018
Filed:
Jul. 13, 2016
Keyence Corporation, Osaka, JP;
Kazuki Natori, Osaka, JP;
Shinya Takahashi, Osaka, JP;
Keyence Corporation, Osaka, JP;
Abstract
Provided are a measurement target measuring method, and a magnifying observation device which make it possible to readily and intuitively recognize a deviation between actual height image data and CAD data concerning a specific portion of a measurement target. A CAD height data generation unit generates a plurality of pieces of CAD height data based on basic CAD data. A reference height data selection unit selects reference height data from the plurality of pieces of CAD height data. A reference appearance image data acquisition unit acquires a reference appearance image corresponding to the reference height data. A target image display unit displays a target image based on texture image data or actual height image data, and a reference image display unit displays a reference image based on the reference appearance image data or the reference height data.