The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2018

Filed:

Dec. 02, 2016
Applicant:

Institute for Information Industry, Taipei, TW;

Inventors:

Kun-Cheng Tsai, Taipei, TW;

I-Hsuan Hong, New Taipei, TW;

Argon Chen, New Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2018.01); D06P 1/00 (2006.01); G05B 13/04 (2006.01);
U.S. Cl.
CPC ...
D06P 1/0032 (2013.01); G05B 13/041 (2013.01);
Abstract

An apparatus, method, and non-transitory computer readable medium thereof for deciding a target control data set of a fabric dyeing process are provided. The apparatus decides a plurality of determination factors of a dyeing quality-related model according to a plurality of control factors corresponding to a plurality of historical control data set and calculates a coefficient corresponding to each of the determination factors. The apparatus further calculates the target control data set that minimizes a dyeing target-related model according to a control condition set, wherein the control condition set includes a predetermined range of the dyeing quality-related model and a predetermined range of each control factor.


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