The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2018

Filed:

Feb. 09, 2015
Applicant:

Toyota Jidosha Kabushiki Kaisha, Toyota-shi, Aichi, JP;

Inventors:

Atsushi Kawakita, Miyoshi, JP;

Shuhei Ogura, Nagakute, JP;

Hiroaki Kishi, Nagoya, JP;

Yuta Iwamoto, Toyota, JP;

Assignee:

TOYOTA JIDOSHA KABUSHIKI KAISHA, Toyota-shi, Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 26/03 (2006.01); B23K 26/24 (2014.01); B23K 31/12 (2006.01); G01J 1/42 (2006.01); B23K 26/22 (2006.01); B23K 26/082 (2014.01);
U.S. Cl.
CPC ...
B23K 26/032 (2013.01); B23K 26/082 (2015.10); B23K 26/22 (2013.01); B23K 31/125 (2013.01); G01J 1/42 (2013.01);
Abstract

A welded portion inspection method accurately identifies emitted light from a molten portion during inspection laser light irradiation, enabling reliable inspection. When transitioning from welding laser light irradiation to inspection laser light irradiation, the welding laser light irradiation is interrupted and then the welding laser light is switched to the inspection laser light. In inspecting a welded portion, two points in time at which the emitted light intensity is equal to or less than a certain threshold value are extracted from an intensity waveform of the emitted light as an inspection start point in time and an inspection end point in time. The interval between the inspection start and end points is estimated as being a irradiation period of the inspection laser light. The welded state is inspected based on the intensity waveform of the emitted light in the irradiation period.


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