The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2018
Filed:
Dec. 22, 2016
Applicant:
Arges Imaging, Inc., Pasadena, CA (US);
Inventors:
Jian Lu, San Gabriel, CA (US);
David Licata, Los Angeles, CA (US);
Assignee:
ARGES IMAGING, INC., Pasadena, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61K 6/00 (2006.01); C09D 139/06 (2006.01); C09D 7/12 (2006.01); C09D 5/33 (2006.01); A61K 6/10 (2006.01); C09D 5/02 (2006.01); A61C 9/00 (2006.01); A61M 11/02 (2006.01); A61M 31/00 (2006.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61K 6/002 (2013.01); A61C 9/006 (2013.01); A61K 6/10 (2013.01); A61M 11/02 (2013.01); A61M 31/005 (2013.01); C09D 5/004 (2013.01); C09D 5/021 (2013.01); C09D 7/1216 (2013.01); C09D 7/1233 (2013.01); C09D 139/06 (2013.01); A61B 2090/395 (2016.02);
Abstract
Provided herein are compositions for applying a reference marker pattern or grid to the surface of an object to be imaged three-dimensionally. These compositions can be quick drying for ease of use. Methods of use of the compositions are also provided as well as devices and kits for the application of the compositions.
Lu, Jian. (2018). Contrast pattern application for three-dimensional imaging (U.S. Patent No. 9968524). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9968524
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile