The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2018

Filed:

Dec. 01, 2010
Applicant:

Martin Weibrecht, Aachen, DE;

Inventor:

Martin Weibrecht, Aachen, DE;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); A61B 6/03 (2006.01); G06F 19/00 (2018.01); G06T 7/00 (2017.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/037 (2013.01); G06F 19/3456 (2013.01); G06T 7/0014 (2013.01); A61B 6/481 (2013.01); G06T 2207/10104 (2013.01);
Abstract

This invention relates to a method and a correction system for correcting tracer-uptake measurements for patient specific variations in the tracer-uptake. Input data are received about the patient and subsequently it is determining whether the received input data include tracer-impact data that impact the tracer-uptake measurements for the patient. In case the tracer-impact data are included in the input data a comparing is performed where the tracer-impact data are compared with pre-stored reference data that have associated thereto a correction indicator indicating an amount of deviation of the tracer-uptake measurement due to the tracer-uptake dependent data. The correction indicator of the pre-stored reference data that match with the tracer-impact data is then used to correct the tracer-uptake measurements for the patient.


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