The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2018
Filed:
Sep. 13, 2012
Guillermo J. Tearney, Cambridge, MA (US);
Brett Eugene Bouma, Quincy, MA (US);
Dvir Yelin, Haifa, IL;
Guillermo J. Tearney, Cambridge, MA (US);
Brett Eugene Bouma, Quincy, MA (US);
Dvir Yelin, Haifa, IL;
The General Hospital Corporation, Boston, MA (US);
Abstract
Exemplary apparatus and process can be provided for imaging information associated with at least one portion of a sample. For example, (i) first different wavelengths of at least one first electro-magnetic radiation can be provided within a first wavelength range provided on the portion of the sample so as to determine at least one first transverse location of the portion, and (ii) second different wavelengths of at least one second electro-magnetic radiation within a second wavelength range can be provided on the portion so as to determine at least one second transverse location of the portion. The first and second ranges can east partially overlap on the portion. Further, a relative phase between at least one third electro-magnetic radiation electro-magnetic radiation being returned from the sample and at least one fourth electro-magnetic radiation returned from a reference can be obtained to determine a relative depth location of the portion.