The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2018

Filed:

Dec. 16, 2015
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Yusuf Eren Ozturk, Istanbul, TR;

Selami Haydar Icli, Istanbul, TR;

Mustafa Yuvalaklioglu, Gebze, TR;

Bryan J. Germann, Greenville, SC (US);

Jason Lee Burnside, Greenville, SC (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06T 7/60 (2017.01); G06T 7/00 (2017.01); G01M 15/14 (2006.01); G01B 11/24 (2006.01); G01B 11/26 (2006.01); G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
H04N 7/18 (2013.01); G01B 11/002 (2013.01); G01B 11/24 (2013.01); G01B 11/26 (2013.01); G01M 15/14 (2013.01); G06T 7/004 (2013.01); G06T 7/60 (2013.01);
Abstract

Locating systems and methods for components are provided. A component has an exterior surface. A method includes locating a surface feature configured on the exterior surface along an X-axis and a Y-axis by analyzing an image of the component to obtain X-axis data points and Y-axis data points for the surface feature. The method further includes directly measuring the surface feature along a Z-axis to obtain Z-axis data points for the surface feature, wherein the X-axis, the Y-axis and the Z-axis are mutually orthogonal. The method further includes calculating at least two of a pitch value, a roll value or a yaw value for the surface feature.


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