The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2018

Filed:

Mar. 18, 2013
Applicant:

Arm Limited, Cambridge, GB;

Inventors:

Andreas Engh Halstvedt, Trondheim, NO;

Sean Tristram Ellis, Farnham, GB;

Jorn Nystad, Trondheim, NO;

Sandeep Kakarlapudi, Trondheim, NO;

Assignee:

Arm Limited, Cambridge, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 1/20 (2006.01); G06T 11/40 (2006.01);
U.S. Cl.
CPC ...
G06T 11/40 (2013.01);
Abstract

A graphics processing pipeline determines whether respective graphics processing operations, such as respective blends, respective depth tests, etc., to be performed at a stage of the graphics processing pipeline would produce the same result for each sampling point of a set of plural sampling points represented by a fragment being processed by the graphics processing pipeline. If it is determined that respective graphics processing operations would produce the same result for each of the sampling points, then only a single instance of the graphics processing operation is performed and the result of that graphics processing operation is associated with each of the sampling points. The number of instances of the graphics processing operations needed to process the set of plural sampling points which the fragment represents is reduced in comparison to conventional multisampling graphics processing techniques which perform graphics processing operations for fragments on a 'per sample' basis. The determination of whether or not the same result would be produced for each sampling point of the set of plural sampling points is facilitated by providing metadata which indicates whether or not fragment data and/or stored sample data for use when processing the sampling points is the same.


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