The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2018
Filed:
Mar. 23, 2017
Institut National D'optique, Québec, CA;
Fabien Claveau, Québec, CA;
Éric Samson, Québec, CA;
Yannick Cadoret, Québec, CA;
Donald Prévost, Québec, CA;
Louis St-Laurent, Québec, CA;
Maxim Mikhnevich, Québec, CA;
INSTITUT NATIONAL D'OPTIQUE, Quebec, Quebec, CA;
Abstract
Calibration methods use a calibration target for obtaining the intrinsic and extrinsic camera parameters of one or more cameras are. The methods can include acquiring, with each camera, a sequence of target images representing the calibration target in different target poses and at different acquisition times. The methods can include identifying reference images from the target images, and defining volume bins, angle bins and multi-camera bins into which the reference images are stored. The reference images can be used to determine the intrinsic and extrinsic parameters of the one or more cameras. In some implementations, the calibration methods can enable a user to monitor the progress of the calibration process, for example by providing an interactive calibration target including an input/output user interface to guide the user in real-time during the acquisition of the target images and/or sensors to provide positional information about the target poses.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile