The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2018
Filed:
Jun. 09, 2016
Qualcomm Incorporated, San Diego, CA (US);
Paulo Ricardo dos Santos Mendonca, Seattle, WA (US);
Christopher Brunner, San Diego, CA (US);
Arvind Ramanandan, San Diego, CA (US);
Murali Ramaswamy Chari, San Diego, CA (US);
Dheeraj Ahuja, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
A first map comprising local features and 3D locations of the local features is generated, the local features comprising visible features in a current image and a corresponding set of covisible features. A second map comprising prior features and 3D locations of the prior features may be determined, where each prior feature: was first imaged at a time prior to the first imaging of any of the local features, and lies within a threshold distance of at least one local feature. A first subset comprising previously imaged local features in the first map and a corresponding second subset of the prior features in the second map is determined by comparing the first and second maps, where each local feature in the first subset corresponds to a distinct prior feature in the second subset. A transformation mapping a subset of local features to a subset of prior features is determined.