The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2018

Filed:

Sep. 30, 2015
Applicant:

Kurt Knodt, Palo Alto, CA (US);

Inventor:

Kurt Knodt, Palo Alto, CA (US);

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/048 (2013.01); G06F 3/0484 (2013.01); G06T 7/62 (2017.01);
U.S. Cl.
CPC ...
G06F 3/04845 (2013.01); G06F 3/04842 (2013.01); G06T 7/62 (2017.01); G06T 2200/24 (2013.01); G06T 2207/20092 (2013.01); G06T 2207/30088 (2013.01);
Abstract

An approach is provided for measuring objects in images of scenes using measurement markers. An image editor retrieves and displays an image of a scene that includes an object of interest and a reference object having a known actual size in the scene in at least one dimension. A user of the image editor overlays a measurement marker on the object of interest in the displayed image. The image editor image editor determines a display size in the image editor of the at least one dimension of the reference object and a display size in the image editor of at least one dimension of the measurement marker. The image editor determines and displays an actual size in the scene of the at least one dimension of the measurement marker. Embodiments allow a user to adjust the scale of the reference object.


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