The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2018

Filed:

Feb. 28, 2014
Applicant:

Honeywell International Inc., Morristown, NJ (US);

Inventors:

Joseph E. Scheitlin, Plymouth, MN (US);

Mats Anders Brenner, Plymouth, MN (US);

Kim A. Class, Andover, MN (US);

Bruce G. Johnson, Shoreview, MN (US);

Randy J. Reuter, Brooklyn Park, MN (US);

John M. Howard, St. Paul, MN (US);

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 19/07 (2010.01); G01S 19/20 (2010.01); G01S 19/08 (2010.01); G01S 19/15 (2010.01); G01S 19/00 (2010.01);
U.S. Cl.
CPC ...
G01S 19/07 (2013.01); G01S 19/20 (2013.01); G01S 19/08 (2013.01); G01S 19/15 (2013.01);
Abstract

A method of implementing a real-time screening process for phase scintillation is presented. The method includes detecting a phase scintillation event during a sample time period at a phase scintillation monitor; excluding associated satellite measurement data from further use based on the detection of the phase scintillation event at the phase scintillation monitor; detecting an end to the phase scintillation event at the phase scintillation monitor; and readmitting associated satellite measurement data collected after the end of the phase scintillation event as detected by the phase scintillation monitor.


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