The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2018

Filed:

Apr. 10, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Sunao Ichihara, Kawasaki, JP;

Natsuhiko Mizutani, Tokyo, JP;

Tetsuo Kobayashi, Kyoto, JP;

Shuji Taue, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/26 (2006.01);
U.S. Cl.
CPC ...
G01R 33/26 (2013.01);
Abstract

There is provided an optically pumped magnetometer, in which a pump light having a first wavelength to spin-polarize a first alkali-metal atom group is made to enter a cell containing the first alkali-metal atom group and a second alkali-metal atom group interacting via spin exchange with the first alkali-metal atom group, a probe light having a second wavelength different from the first wavelength to measure spin polarization of the second alkali-metal atom group is made to enter the cell to form the same optical axis as the pump light, a wavelength discrimination unit is provided to discriminate between the pump light and the probe light that passed through the cell depending on a different in wavelength, and the rotation angle of a polarization plane of the probe light that passed through the cell is measured so that the degree of flexibility of the device layout can be increased.


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