The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2018

Filed:

Sep. 19, 2014
Applicant:

Sintokogio, Ltd., Nagoya-shi, Aichi, JP;

Inventors:

Yoshiyasu Makino, Toyokawa, JP;

Kazuhiro Ota, Toyokawa, JP;

Hideaki Kaga, Toyokawa, JP;

Assignee:

SINTOKOGIO, LTD., Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/90 (2006.01);
U.S. Cl.
CPC ...
G01N 27/9046 (2013.01); G01N 27/90 (2013.01); G01N 27/9086 (2013.01);
Abstract

To provide a surface property inspection device and method capable of inspecting the surface treatment state of treated material subjected to surface treatments. A surface property inspection deviceincludes an AC power supply, an AC bridge circuit, and an evaluation apparatus, and the AC bridge circuitis formed by a variable resistorwith a distribution ratio of γ, a reference detector, and an inspection detector. The inspection detectorincludes a coilwound so as to oppose the surface property inspection area of the test object M; an eddy current is excited in the test object M by supplying AC power to the coil. A reference test object S with the same structure as the test object M is placed in the reference detectorto cancel inspection environment effects.


Find Patent Forward Citations

Loading…