The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2018

Filed:

May. 06, 2015
Applicant:

Panasonic Corporation, Osaka, JP;

Inventors:

Yasuaki Okumura, Kyoto, JP;

Tatsurou Kawamura, Kyoto, JP;

Masahiko Shioi, Kyoto, JP;

Masaru Minamiguchi, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01); A61B 5/00 (2006.01); A61B 5/1455 (2006.01); A61B 5/145 (2006.01); A61B 5/1459 (2006.01);
U.S. Cl.
CPC ...
G01N 21/658 (2013.01); A61B 5/1455 (2013.01); A61B 5/1459 (2013.01); A61B 5/14532 (2013.01); G01N 2201/068 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/12 (2013.01);
Abstract

An exemplary sensor chip includes a substrate, a metal pattern formed on a side of the substrate that is irradiated with excitation light, and a first substance and a second substance provided near the metal pattern. A first intensity Xa of the first surface-enhanced Raman-scattered light from the first substance and a second intensity Xb of the second surface-enhanced Raman-scattered light from the second substance are detected. An intensity ratio Xc, as obtained by dividing the second intensity Xb with the first intensity Xa, is calculated.


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