The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2018
Filed:
Jul. 18, 2016
Deere & Company, Moline, IL (US);
Wolfram Haiges, Magstadt, DE;
Georg Kormann, Zweibruecken, DE;
Deere & Company, Moline, IL (US);
Abstract
A grain measurement device () comprises a chamber () having an inlet () and an outlet () for grain that is to be tested. A spectrometer is equipped with a light source () and a detector () for light which was generated by the light source () and was transmitted through the sample. The detector () is connected to an analyzer () for wavelength-resolved analysis of the received light. A mounting () of one of the light source () or detector () can be moved with respect to the other (by a drive (), which moves the mounting () for purposes of conveying the sample either in the flow direction () or in the opposite direction, in order to break up the sample or to avoid bridging and/or jamming of the sample in the measurement chamber ().