The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2018
Filed:
Jul. 03, 2015
Jedex Inc., Yongin-si, Gyeonggi-do, KR;
Jin Ho Kim, Suwon-si, KR;
JEDEX INC., Yongin-si, Gyeonggi-do, KR;
Abstract
The present invention relates to a test film for detecting surface particles in a clean room in order to prevent inferior products by measuring the contamination level of the clean room using the surface particles. The present invention provides a test film for detecting surface particles in a cleanroom, the test film comprising a substrate which has a predetermined thickness and is formed of a transparent synthetic resin material; a first adhesive layer which is formed at one side of the substrate and collects the surface particles; a release film which is adhered to the first adhesive layer and is separated from the first adhesive layer when the surface particles are collected; a second adhesive layer which is formed at the other side of the substrate; and a protective film which is adhered to the second adhesive layer so as to protect the substrate and has gradations indicated thereon. According to the present invention, there is an effect in that it is possible to easily and quickly check whether or not a clean room is contaminated by collecting, on the adhesive layer-applied surface of a substrate to which an adhesive is applied, surface particles adhered to an object to be measured, and then measuring the number, size, distribution, etc. of the surface particles with the naked eye or using instruments such as a light, a magnifier, a microscope, or the like.