The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2018
Filed:
Dec. 08, 2014
Applicant:
Bentley Systems, Incorporated, Exton, PA (US);
Inventors:
Zheng Yi Wu, Watertown, CT (US);
Xiaohua Yi, Houston, TX (US);
Assignee:
Bentley Systems, Incorporated, Exton, PA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 21/133 (2006.01); G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G01M 99/00 (2013.01); G01R 21/133 (2013.01);
Abstract
In one example embodiment, an analysis application is used to optimize sensor placement by implementing a two-part optimization solution procedure, involving generating a contribution database, and determining an optimized sensor location set using the contribution database. The optimized sensor location set may indicate locations that maximize coverage of dynamic integrity, which is quantified by as a ratio of detectable damage scenarios to all damage scenarios used by the analysis application.