The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2018

Filed:

Oct. 02, 2014
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Mark Allen Cheverton, Mechanicville, NY (US);

Anant Achyut Setlur, Niskayuna, NY (US);

Victor Petrovich Ostroverkhov, Ballston Lake, NY (US);

Guanghua Wang, Clifton Park, NY (US);

James Anthony Brewer, Scotia, NY (US);

Venkat Subramaniam Venkataramani, Clifton Park, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2006.01); G01L 1/24 (2006.01); G01K 1/14 (2006.01); G01K 11/20 (2006.01);
U.S. Cl.
CPC ...
G01L 1/24 (2013.01); G01K 1/143 (2013.01); G01K 11/20 (2013.01);
Abstract

A method of monitoring a surface temperature of a hot gas path component includes directing an excitation beam having an excitation wavelength at a layer of a sensor material composition deposited on a hot gas path component to induce a fluorescent radiation. The method includes measuring fluorescent radiation emitted by the sensor material composition. The fluorescent radiation includes at least a first intensity at a first wavelength and a second intensity at a second wavelength. The surface temperature of the hot gas path component is determined based on a ratio of the first intensity at the first wavelength and the second intensity at the second wavelength of the fluorescent radiation emitted by the sensor material composition.


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