The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2018
Filed:
Jul. 09, 2014
Polyrix Inc., Québec, CA;
Jean-Daniel Deschenes, Québec, CA;
Philippe Lambert, Québec, CA;
Nicolas Martel-Brisson, Québec, CA;
Sébastien Quirion, Québec, CA;
POLYRIX INC., Quebec, Quebec, CA;
Abstract
A system for inspecting an object has at least one light projector and at least one camera jointly defining a field of view and a computer operatively connected thereto. The computer is configured to acquire object data representative of the outer surface of the object through projection of light thereon by the light projector and acquisition of return light by the camera. The object data relates surface points on the outer surface of the object to one or more source point of the light projector. The computer is further configured to generate inspection information data based on the acquired object data and project the inspection information data on at least some of the surface points of the outer surface of the object using the corresponding source points of the at least one light projector. A method inspects an outer surface of an object.