The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2018
Filed:
Nov. 04, 2016
Com Dev Ltd., Mississauga, CA;
Alan Scott, Arnprior, CA;
Hugh Podmore, Toronto, CA;
COM DEV LTD., Mississauga, CA;
Abstract
A spectrometer and method for determining an emitted light spectrum. An input light signal is received and directed to an array of interferometers using waveguides. A plurality of self-interfering signals are detected from a first plurality of interferometers in the array of interferometers. The first plurality of interferometers has fewer interferometers than required to satisfy the Nyquist criterion for reconstructing the emitted light spectrum. The emitted light spectrum is reconstructed from the plurality of self-interfering signals using compressive sensing. The plurality of self-interfering signals can provide an interference pattern used to reconstruct the emitted light spectrum. A second plurality of interferometers may output a second plurality of self-interfering signals to reconstruct a low resolution spectrum of the input light signal satisfying the Nyquist criterion. Low resolution signal components can be detected from the low resolution spectrum and used to pre-process the interference pattern.