The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2018

Filed:

Apr. 02, 2014
Applicants:

Sumitomo Electric Industries, Ltd., Osaka-shi, JP;

Sumitomo Electric Hardmetal Corp., Itami-shi, JP;

Inventors:

Yoshiki Nishibayashi, Itami, JP;

Akihiko Ueda, Itami, JP;

Hitoshi Sumiya, Itami, JP;

Yutaka Kobayashi, Itami, JP;

Yuichiro Seki, Itami, JP;

Toshiya Takahashi, Itami, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C30B 29/04 (2006.01); C30B 25/00 (2006.01); C30B 25/10 (2006.01);
U.S. Cl.
CPC ...
C30B 29/04 (2013.01); C30B 25/00 (2013.01); C30B 25/105 (2013.01);
Abstract

A single crystal diamond () is provided as a single crystal diamond into which a defect portion () is introduced. The defect portion () can be detected by a phase difference occurring when the single crystal diamond () is irradiated with circularly polarized light. In the single crystal diamond (), a maximum value of average values of the phase differences measured within a measurement region (M) formed in a shape of a square having a side length of 1 mm is 30 nm or more.


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