The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2018
Filed:
Apr. 02, 2012
Jan Johannes Gerardus DE Vries, Eindhoven, NL;
Martin Ouwerkerk, Culemborg, NL;
Jan Johannes Gerardus De Vries, Eindhoven, NL;
Martin Ouwerkerk, Culemborg, NL;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
A stress-measuring device () and method determines a level () of stress of a user (), in particular long-term stress. The stress-measuring device () includes an input interface () for receiving a skin conductance signal () indicating the skin conductance of the user (), the skin conductance signal () over time forming skin conductance trace data (). The stress-measuring device () further includes a processing unit () for processing the skin conductance trace data (). The processing unit () determines, over at least a portion of the skin conductance trace data (), values of a rise time (tr) between at least two different points of the skin conductance trace data (), a frequency distribution of the rise time (tr) values, and the level () of stress of the user () based on the determined frequency distribution.