The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2018
Filed:
Oct. 12, 2016
Olympus Corporation, Tokyo, JP;
Soichiro Koshika, Mitaka, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
An optical scanning observation system includes: an endoscope having an optical scanning portion for scanning an object; a drive signal generation portion configured to generate a drive signal and supply the signal to the optical scanning portion; an electric-current measurement portion configured to measure an electric current value of the drive signal; a first storage portion in which a measured electric current value when the temperature of the optical scanning portion is a predetermined temperature is stored; a second storage portion in which a plurality of parameters that are set according to the size of the measured electric current value are stored; and a correction processing portion configured to correct a scanning range of the endoscope by reading in from the second storage portion a parameter that corresponds to the size of the measured electric current value read in from the first storage portion.