The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2018
Filed:
Sep. 30, 2015
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Richard B. Finch, New Paltz, NY (US);
Jason T. Hirst, Poughkeepsie, NY (US);
Gerald G. Stanquist, Salt Point, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H05K 7/20 (2006.01); F25B 47/00 (2006.01); G06F 1/20 (2006.01);
U.S. Cl.
CPC ...
H05K 7/20763 (2013.01); F25B 47/006 (2013.01); G06F 1/20 (2013.01); G06F 2200/201 (2013.01);
Abstract
An approach is provided in which a manufacturing test scheduling system predicts a dew point forecast indoor a facility based upon outdoor weather data and indoor environment data. The manufacturing test scheduling system selects time slots in the dew point forecast based upon a pre-defined dew point threshold and, in turn, schedules tests of a liquid cooled computer system during the selected time slots.