The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2018

Filed:

Dec. 21, 2016
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Paul William Morrison, Erskine Park, AU;

Ben Yip, Ryde, AU;

Cameron Murray Edwards, Clovelly, AU;

Eric Wai Shing Chong, Carlingford, AU;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/31 (2006.01);
U.S. Cl.
CPC ...
H04N 9/3185 (2013.01); H04N 9/3147 (2013.01); H04N 9/3194 (2013.01);
Abstract

A method of aligning two portions of an image, the portions being projected by projectors on a surface to form respective projected portions of the image, a calibration pattern being embedded in each of the two portions, the method comprising capturing from the surface an image of the pattern from the projected portions, the calibration pattern extending across a combined projection area of the projectors; locating an overlap area according to locations of calibration points; determining projector image coordinates dependent upon locations in the overlap area; and aligning the two portions of the image according to the locations of control points and the locations in the overlap area.


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