The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2018

Filed:

May. 27, 2013
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Masaki Kimura, Tokyo, JP;

Takahiro Yasui, Tokyo, JP;

Norihiro Hara, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04L 29/06 (2006.01); G06F 11/07 (2006.01); H04L 12/24 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
H04L 43/0876 (2013.01); G06F 11/3055 (2013.01); H04L 41/08 (2013.01); H04L 43/0823 (2013.01); G06F 11/0709 (2013.01); G06F 11/3006 (2013.01); H04L 41/28 (2013.01); H04L 63/02 (2013.01);
Abstract

[Object] A monitoring item selection method, device and a storage medium capable of simplifying operation and management of a system that frequently undergoes configuration changes are proposed. [Solution] Operation information concerning resources in the monitoring target device and nodes that run on the monitoring target device and make use of the resources to execute processing are periodically or randomly acquired from a monitoring target device. A relation between the nodes and a relation between the nodes and the resources based on the acquired operation information are extracted. Monitoring items of the monitoring target device are selected based on the operation information, the extracted relation between the nodes and relation between the nodes and the resources, and a pre-defined condition.


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