The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2018

Filed:

Feb. 13, 2012
Applicants:

Carsten Giebeler, Edinburgh, GB;

Neil Conway, Fife, GB;

Inventors:

Carsten Giebeler, Edinburgh, GB;

Neil Conway, Fife, GB;

Assignee:

Pyreos LTD, Edinburgh, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/34 (2006.01); H01L 41/187 (2006.01); C23C 14/00 (2006.01); C23C 14/08 (2006.01); H01L 21/02 (2006.01); H01L 37/02 (2006.01); H01L 41/316 (2013.01);
U.S. Cl.
CPC ...
H01L 41/1876 (2013.01); C23C 14/0036 (2013.01); C23C 14/088 (2013.01); C23C 14/3464 (2013.01); H01L 21/02197 (2013.01); H01L 21/02266 (2013.01); H01L 37/025 (2013.01); H01L 41/316 (2013.01);
Abstract

The invention relates to a method for producing the thin film made of lead zirconate titanate in a 111-oriented perovskite structure, comprising the following steps: providing a substrate having a substrate temperature above 450° C. and a lead target, a zirconium target, and a titanium target; applying the thin film by sputtering lead, zirconium, and titanium from the respective targets onto the substrate, wherein the total deposition rate of lead, zirconium, and titanium is greater than 10 nm/min, the deposition rate of zirconium is selected in such a way that the atomic concentration of zirconium with respect to the atomic concentration of zirconium together with titanium in the thin film is between 0.2 and 0.3, and the deposition rate of lead is selected to be sufficiently low, depending on the substrate temperature and the total deposition rate of lead, zirconium, and titanium, for an X-ray diffractometer graph of the 111-oriented lead zirconate titanate to have a significant peak value (19) in a diffraction angle range from 33 to 35.5°; and completing the thin film.


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