The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2018

Filed:

Jun. 16, 2015
Applicant:

Purdue Research Foundation, West Lafayette, IN (US);

Inventors:

Zheng Ouyang, West Lafayette, IN (US);

Xiao Wang, West Lafayette, IN (US);

Xiaoyu Zhou, Beijing, CN;

Assignee:

Purdue Research Foundation, West Lafayette, IN (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/04 (2006.01); H01J 49/04 (2006.01); H01J 49/24 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
H01J 49/04 (2013.01); H01J 49/0013 (2013.01); H01J 49/0468 (2013.01); H01J 49/24 (2013.01);
Abstract

The invention generally relates to systems and methods for analyzing a sample from a surface. In certain aspects, the invention provides systems that include a sample introduction member that has an inlet, an outlet, and an opening along a wall of the sample introduction member. The sample introduction member may be configured such that the opening couples with a surface that includes a sample in a manner in which molecules of the sample enter the sample introduction member via the opening and exit the sample introduction member via the outlet. A mass spectrometer is configured to receive the molecules of the sample.


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