The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2018

Filed:

Feb. 08, 2017
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Harumitsu Miyashita, Nara, JP;

Yasumori Hino, Nara, JP;

Junichi Minamino, Nara, JP;

Tsutomu Kai, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 20/18 (2006.01); G11B 20/12 (2006.01); G11B 7/09 (2006.01); G11B 19/04 (2006.01); G11B 20/10 (2006.01); G11B 7/0037 (2006.01);
U.S. Cl.
CPC ...
G11B 20/1816 (2013.01); G11B 7/0948 (2013.01); G11B 19/041 (2013.01); G11B 20/10314 (2013.01); G11B 20/1217 (2013.01); G11B 20/18 (2013.01); G11B 7/0037 (2013.01); G11B 2020/1238 (2013.01);
Abstract

An inspection method for a recordable optical disc includes focusing laser light on a recording layer and obtaining a data signal dependent on the laser light reflected by the recording layer. The inspection method also includes determining whether the optical disc includes a defect or not by identifying a first period every second period in the obtained data signal obtained, the first period being a period in which a signal level of the data signal is lower than a predetermined value, and each of the second periods corresponding to an ECC block, and outputting a result of the determination.


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