The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2018
Filed:
Jan. 15, 2016
Dirk Ertel, Neunkirchen am Brand, DE;
Yiannis Kyriakou, Spardorf, DE;
Dirk Ertel, Neunkirchen am Brand, DE;
Yiannis Kyriakou, Spardorf, DE;
Siemens Aktiengesellschaft, München, DE;
Abstract
A method for improving the image quality of a three-dimensional magnetic resonance image dataset recorded with a magnetic resonance device, wherein, from at least one correction image dataset recorded with a modality other than magnetic resonance imaging, registered with the magnetic resonance image dataset, showing at least partly the same recording region as the magnetic resonance image dataset, especially an x-ray image dataset, relevant material parameters are derived locally-resolved for the magnetic resonance imaging, which are used for establishing a virtual magnetic resonance comparison dataset in a simulation wherein, as a function of a comparison between the magnetic resonance image dataset and the magnetic resonance comparison dataset, at least one measure parameter describing an image quality improvement measure to be applied in the k-space is determined and the image quality improvement measure is carried out with the measure parameter relating to the magnetic resonance image dataset.