The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2018

Filed:

Mar. 29, 2016
Applicant:

Hiroshima University, Higashi-Hiroshima-shi, Hiroshima, JP;

Inventors:

Tetsushi Koide, Hiroshima, JP;

Hoang Anh Tuan, Hiroshima, JP;

Masaharu Yamamoto, Hiroshima, JP;

Tsubasa Mishima, Hiroshima, JP;

Assignee:

HIROSHIMA UNIVERSITY, Hiroshima, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06K 9/52 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00818 (2013.01); G06K 9/4642 (2013.01); G06K 9/4647 (2013.01); G06K 9/4652 (2013.01); G06K 9/52 (2013.01); G06K 2009/4666 (2013.01); G06K 2209/01 (2013.01); G06T 2207/20021 (2013.01);
Abstract

In a symbol recognition device, each histogram computation module receives an image of each partial region of a recognition target region in a binarized image and computes a frequency distribution of pixels of a given color in each line or column in the partial region; each run length determination module receives an image of each partial region of the recognition target region and determines whether or not a line or column of pixels of the given color having a certain length is present in the partial region; a control module feeds pixel information of the partial regions, read by scanning the binarized image stored in the image memory, into the histogram computation modules and the run length determination modules; a determination module determines a symbol included in the binarized image based on computation results of the histogram computation modules and determination results of the run length determination modules.


Find Patent Forward Citations

Loading…