The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2018

Filed:

Nov. 22, 2013
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Min-Ju Lee, Hwaseong-si, KR;

Bernhard Egger, Seoul, KR;

Jae-jin Lee, Seoul, KR;

Young-Lak Kim, Seongnam-si, KR;

Hong-Gyu Kim, Seoul, KR;

Hong-June Kim, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3466 (2013.01); G06F 11/348 (2013.01); G06F 11/3409 (2013.01); G06F 2201/86 (2013.01); G06F 2201/88 (2013.01);
Abstract

A dynamic library profiling method and a dynamic library profiling system including writing a first break point instruction at a start address of a dynamic library function, recording a first event count value that is a process performance management unit (PMU) count when a target process executes the first break point instruction, writing a second break point instruction to a return address of the dynamic library function, and calculating a PMU count generated in a processor core while the dynamic library function is executed, by comparing the recorded first event count value with a second event count value that is a process PMU count when the target process executes the second break point instruction, wherein the process PMU count is a cumulative value of PMU counts generated in the processor core while the target process is executed.


Find Patent Forward Citations

Loading…