The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2018

Filed:

Oct. 13, 2015
Applicant:

Honeywell International Inc., Morris Plains, NJ (US);

Inventors:

Raghupathy Kolandavelu, TamilNadu, IN;

Tim Felke, Damascus, MD (US);

MoghanaPriya Kesavan, Karnataka, IN;

Ramchandra Reddy K, Telangana, IN;

Tim Mahoney, Chandler, AZ (US);

Assignee:

HONEYWELL INTERNATIONAL INC., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0751 (2013.01); G06F 11/0787 (2013.01);
Abstract

A method for creating and using a fault model representative of a system, the fault model comprising one or more fault model components is provided. The method creates a reusable fault model component; associates one or more algorithms to the reusable fault model component, the one or more algorithms describing behavior of the reusable fault model component; incorporates the reusable fault model component and the one or more algorithms into the fault model; tunes the reusable fault model component, using available data associated with the fault model; and predicts occurrence of degradation of the system, based on the tuning.


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