The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2018

Filed:

Nov. 16, 2015
Applicant:

Heraeus Electro-nite International N.v., Houthalen, BE;

Inventors:

Paul A. Turner, Milwaukee, WI (US);

Harry G. Clauss, Jr., Delanco, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/20 (2006.01); G01K 7/02 (2006.01); B22D 2/00 (2006.01); G01N 1/12 (2006.01);
U.S. Cl.
CPC ...
G01N 33/206 (2013.01); B22D 2/006 (2013.01); G01K 7/02 (2013.01); G01N 1/125 (2013.01);
Abstract

A drop-in probe for determining phase changes by thermal analysis of a sample of a molten metal includes a measurement head having a first end which is an immersion end and an opposing second end having an end face. A sample chamber is arranged within the measurement head. An opening, which is free of any restrictions and which is in communication with the sample chamber, is formed in the end face of the second end of the measurement head. The sample chamber includes a first thermocouple having a first thermocouple junction enclosed within a wall which has a uniform internal geometry. A ratio D/H of an internal diameter D of the sample chamber to a length H extending between the opening and the first thermocouple junction is between 0.1 and 1.2.


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