The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2018
Filed:
Jun. 10, 2013
Applicant:
Arise Global Pte. Ltd., Singapore, SG;
Inventors:
Noam Amir, Ness-Ziona, IL;
Dov Furman, Rehovot, IL;
Harel Primack, Rishon LeZion, IL;
Silviu Zilberman, Rishon Le-Zion, IL;
Assignee:
ARISE GLOBAL PTE. LTD, Singapore, SG;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/24 (2006.01); G01M 5/00 (2006.01); G01N 29/04 (2006.01);
U.S. Cl.
CPC ...
G01N 29/043 (2013.01); G01M 5/0033 (2013.01); G01M 5/0066 (2013.01); G01N 29/24 (2013.01); G01N 2291/044 (2013.01); G01N 2291/0425 (2013.01); G01N 2291/2636 (2013.01);
Abstract
Tube inspections are performed by combining the use of APR technology with GW technology. The reflections measured by both technologies are compared to each other and used to more specifically identify the type and location of a flaw or anomaly that appears in the interior of the tube. Further, embodiments of novel probes to be used in GW technique for inspecting tubes with mechanical waves having bandwidth that is equal to 150 KHz or more are disclosed.