The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2018
Filed:
Apr. 02, 2015
Applicant:
Industry-academic Cooperation Foundation Yonsei University, Seoul, KR;
Inventor:
Jae Won Hahn, Seoul, KR;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/30 (2006.01); G01J 3/02 (2006.01); G01J 3/443 (2006.01); H01J 49/04 (2006.01); H05K 9/00 (2006.01); H01J 49/06 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0229 (2013.01); G01J 3/0286 (2013.01); G01J 3/443 (2013.01); H01J 49/0422 (2013.01); H01J 49/068 (2013.01); H05K 9/009 (2013.01);
Abstract
A device for a device for preventing the intensity reduction of an optical signal, an optical emission spectrometer, an optical instrument, and a mass spectrometer including the same are provided. The device for preventing the intensity reduction includes a shielding filter which has a mesh structure capable of blocking RF electromagnetic waves radiated from a plasma field for a wafer processing, is installed in the front of an optical window of an optical emission spectrometer for measuring the plasma field from an emission spectrum image of the plasma field, and collects charging particles passing through the mesh.