The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2018
Filed:
Oct. 14, 2015
Finetek Co., Ltd., New Taipei, TW;
FINETEK CO., LTD., New Taipei, TW;
Abstract
A probe () of a material level measuring apparatus () inserts into a container (). The material level measuring apparatus () transmits an electromagnetic wave signal. When the electromagnetic wave signal touches a surface of a material (), a first reflected signal is generated. When the electromagnetic wave signal touches a bottom of the probe (), a second reflected signal is generated. According to the first reflected signal and the second reflected signal, a first time-passing difference value (t) and a second time-passing difference value (t) are obtained. According to the first time-passing difference value (t), the second time-passing difference value (t) and a predetermined empty container time-passing difference value (t), a first material level and a second material level are obtained. According to the first material level and the second material level, a third material level is obtained.