The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2018
Filed:
Jul. 09, 2015
Clemson University, Clemson, SC (US);
Amadas Industries, Inc., Suffolk, VA (US);
Kendall R. Kirk, Pendleton, SC (US);
J. Warren White, Suffolk, VA (US);
W. Scott Monfort, Aiken, SC (US);
Hunter F. Massey, Liberty, SC (US);
D. Hollens Free, Blackville, SC (US);
Stanley A. Brantley, Suffolk, VA (US);
Joel S. Peele, Suffolk, VA (US);
Jacob B. Fravel, Central, SC (US);
William G. Henderson, Jr., Warrenville, SC (US);
Clemson University, Clemson, SC (US);
Abstract
Yield monitoring systems for harvesting machines and methods that can provide yield monitoring of crops are described. Machines include those that pneumatically convey crop through the machine such as peanut harvesting machines. The yield monitoring system includes a force sensor that can be located in conjunction with a duct of the harvesting machine such that impact of the crop materials on an impact plate within the duct will be registered by the force sensor. This registration can be used to determine a mass flow rate for the crop, which can be correlated to yield of the crop. The systems can include additional components such as optical monitors, moisture sensors, and pressure sensors.