The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2018

Filed:

Sep. 06, 2016
Applicant:

Fanuc Corporation, Minamitsuru-gun, Yamanashi, JP;

Inventor:

Kyouhei Kokubo, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/04 (2006.01); G05B 19/18 (2006.01); B25J 9/16 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1638 (2013.01); G05B 2219/39176 (2013.01);
Abstract

A measured mark is arranged on a link of an articulated robot. A camera for measuring a position of the measured mark is arranged at a position distant from the articulated robot. A control apparatus of the articulated robot changes posture of the articulated robot, measures positions of the measured mark respectively before and after a change of the posture by the camera, and calculates an actual deflection amount of the link based on a movement amount between the position of the measured mark measured before the change of the posture and the position of the measured mark measured after the change of the posture.


Find Patent Forward Citations

Kokubo, Kyouhei. (2018). Deflection measurement system for measuring deflection of articulated robot (U.S. Patent No. 9956686). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9956686

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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