The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2018

Filed:

Apr. 14, 2014
Applicant:

Huazhong University of Science and Technology, Wuhan, CN;

Inventors:

Wenzhong Liu, Wuhan, CN;

Shiqiang Pi, Wuhan, CN;

Wenping Mao, Wuhan, CN;

Jing Zhong, Wuhan, CN;

Le He, Wuhan, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/01 (2006.01); A61B 5/00 (2006.01); A61B 5/05 (2006.01); G01K 7/36 (2006.01); G01R 33/12 (2006.01);
U.S. Cl.
CPC ...
A61B 5/7278 (2013.01); A61B 5/01 (2013.01); A61B 5/0515 (2013.01); G01K 7/36 (2013.01); G01R 33/1276 (2013.01);
Abstract

The present disclosure relates to methods and systems for magnetic nanoparticle temperature imaging. Particularly, the present methods involve applying different combinations of magnetic fields to magnetic nanoparticles placed in a one-dimensional space, collecting AC magnetization signals of the magnetic nanoparticles, and analyzing the collected signals to obtain in vivo temperature information of the one-dimensional space. Different exciting magnetic fields are applied to the magnetic nanoparticles, so that one-dimensional temperature imaging is transformed into single-point temperature measurement of each minizone, and one-dimensional temperature imaging can be precisely and quickly achieved without knowing the concentration distribution of the magnetic nanoparticles.


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