The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2018

Filed:

Jul. 12, 2016
Applicants:

Mark A. Readdie, Santa Cruz, CA (US);

Jeremy G. Chatwin, Santa Cruz, CA (US);

Omondi L. Nyong'o, San Francisco, CA (US);

Inventors:

Mark A. Readdie, Santa Cruz, CA (US);

Jeremy G. Chatwin, Santa Cruz, CA (US);

Omondi L. Nyong'o, San Francisco, CA (US);

Assignee:

Getchell Technologies LLC, Santa Cruz, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B 23/00 (2006.01); A61B 5/00 (2006.01); A61F 9/04 (2006.01);
U.S. Cl.
CPC ...
A61B 5/4833 (2013.01); A61B 5/6803 (2013.01); A61F 9/04 (2013.01); A61B 5/6821 (2013.01); A61B 2562/0223 (2013.01);
Abstract

A magnetometer-based monitoring system comprising a magnet integrated with an object whose disposition is to be monitored, a first magnetometer secured in proximity to the object, and a second magnetometer secured at a fixed distance from the first magnetometer in proximity to the object. The monitoring system further comprising a processor to receive data from the first magnetometer and the second magnetometer, and calculate a measurement vector to determine the disposition of the object.


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