The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2018
Filed:
Dec. 15, 2014
Essilor International (Compagnie Generale D'optique), Charenton-le-Pont, FR;
Benjamin Rousseau, Charenton-le-Pont, FR;
Martha Hernandez, Charenton-le-Pont, FR;
Konogan Baranton, Charenton-le-Pont, FR;
Pedro Ourives, Charenton-le-Pont, FR;
Gildas Marin, Charenton-le-Pont, FR;
ESSILOR INTERNATIONAL (COMPAGNIE GENERALE D'OPTIQUE), Charenton-le-pont, FR;
Abstract
The invention relates to a device for measuring the subjective refraction of a person in near and/or medium vision, which comprises, according to the invention, for each eye of the person, a correction mounting () provided with at least one corrective lens, the correction mountings () being arranged such that the person looks through the lenses. The position of each correction mounting () is variable such as to adjust an angle (a) between the axes of the lenses.