The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2018

Filed:

Mar. 07, 2016
Applicants:

Liang Gao, Santa Clara, CA (US);

Ivana Tosic, San Francisco, CA (US);

Inventors:

Liang Gao, Santa Clara, CA (US);

Ivana Tosic, San Francisco, CA (US);

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/00 (2006.01); A61B 3/10 (2006.01); A61B 3/107 (2006.01); A61B 3/117 (2006.01); A61B 3/15 (2006.01); G06T 7/557 (2017.01);
U.S. Cl.
CPC ...
A61B 3/0025 (2013.01); A61B 3/107 (2013.01); A61B 3/1015 (2013.01); A61B 3/1173 (2013.01); A61B 3/158 (2013.01); A61B 3/14 (2013.01); G06T 7/557 (2017.01);
Abstract

A single imaging platform for making in vivo measurements of an individual's eye, where the measurements are sufficient to construct an optical model of the individual's eye. The platform includes a plenoptic opthalmic camera and an illumination module. In one configuration, the plenoptic opthalmic camera captures a plenoptic image of a corneal anterior surface of the individual's eye. In another configuration, the plenoptic opthalmic camera operates as a wavefront sensor to measure a wavefront produced by the individual's eye.


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