The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Mar. 31, 2016
Applicant:

Verizon Patent and Licensing Inc., Arlington, VA (US);

Inventors:

Ye Ouyang, Piscataway, NJ (US);

Carol Becht, Boonton, NJ (US);

Krishna Pichumani Iyer, Aurora, IL (US);

Assignee:

Verizon Patent and Licensing Inc., Basking Ridge, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 72/08 (2009.01); H04W 24/08 (2009.01); H04W 16/00 (2009.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04W 72/085 (2013.01); H04L 41/0896 (2013.01); H04L 41/16 (2013.01); H04L 41/5009 (2013.01); H04W 16/00 (2013.01); H04W 24/08 (2013.01);
Abstract

A recursive algorithm may be applied to group cells in a service network into a small number of clusters. For each of the clusters, different regression algorithms may be evaluated, and a regression algorithm generating a smallest error is selected. A total error for the clusters may be identified based on the errors from the selected regression algorithms and from degrees of separation associated with the cluster. If the total error is greater than a threshold value, the cells may be grouped into a larger number of clusters and the new clusters may be re-evaluated. A key performance indicator (KPI) may be estimated for a cell based on a regression algorithm selected for the cluster associated with the cell. A resources may be allocated to the cell based on the KPI value.


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