The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

May. 15, 2017
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventor:

Jong-Pil Son, Seongnam-si, KR;

Assignee:

SAMSUNG ELECTRONICS CO., LTD., Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01); G11C 11/419 (2006.01); G06F 11/10 (2006.01); G11C 7/18 (2006.01); G11C 29/04 (2006.01); G11C 7/08 (2006.01);
U.S. Cl.
CPC ...
G11C 11/419 (2013.01); G06F 11/1048 (2013.01); G11C 7/08 (2013.01); G11C 7/18 (2013.01); G11C 29/04 (2013.01);
Abstract

A semiconductor memory device includes a memory cell array, a control logic circuit, an internal processing circuit, and an error correction circuit. The control logic circuit generates an internal processing mode signal in response to a command from a memory controller. The internal processing circuit selectively performs the internal processing operation on a first set of data read from the memory cell array to output a processing result data, in response to the internal processing mode signal. The error correction circuit performs an error correction code (ECC) encoding on the processing result data to generate a second parity data and stores the processing result data and the second parity data in the memory cell array. The error correction circuit generates the second parity data by selecting the same ECC of a plurality of ECCs as a first ECC.


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